Process capability: Cp, Cpk, DPMO
Process capability measures how well a process fits within its specification limits. A capable process consistently produces output within spec without requiring sorting or rework. Cp and Cpk are the standard indices; DPMO and sigma level translate capability into defect rates.
Key definitions
| Term | Symbol | Meaning |
|---|---|---|
| Upper spec limit | USL | Maximum acceptable value |
| Lower spec limit | LSL | Minimum acceptable value |
| Process mean | μ or x̅ | Average of measured values |
| Process std dev | σ or s | Spread of the process output |
| Spec width | USL − LSL | Total tolerance allowed |
Cp: potential capability
Cp compares the width of the specification to the width of the process. It assumes the process is centered on the target.
- Cp ≥ 1.33: commonly accepted as capable (spec limits at least 4σ from a centered mean)
- Cp = 1.0: exactly fits (3σ on each side; about 0.27% out of spec if normal and centered)
- Cp < 1.0: process is wider than the spec; defects are inevitable
Cp ignores centering. A process can have a high Cp but still produce many defects if it is off-center.
Cpk: actual capability
Cpk accounts for both spread and centering. It is always ≤ Cp.
- Cpk = Cp when the process is perfectly centered
- Cpk < 0: the process mean is outside a spec limit
- Cpk = 1.33 is a common minimum target (customers and industries set their own)
Worked example: Examplorphine fill weight
Process data: x̅ = 251.5 mg, s = 1.2 mg
Interpretation: The process has sufficient spread (Cp = 1.39) but is shifted high. The upper tail will produce defects above 255 mg. Action: re-center the process to the target (250 mg).
Sigma level and DPMO
DPMO (Defects Per Million Opportunities) and sigma level provide a universal quality language across industries.
| Sigma level | DPMO | Yield |
|---|---|---|
| 2σ | 308,537 | 69.15% |
| 3σ | 66,807 | 93.32% |
| 4σ | 6,210 | 99.38% |
| 5σ | 233 | 99.977% |
| 6σ | 3.4 | 99.9997% |
The 6σ DPMO of 3.4 assumes a 1.5σ long-term shift of the process mean from target — the "Six Sigma shift." A truly centered process at 6σ would produce ~0.002 DPMO.
Pp and Ppk (performance indices)
Pp and Ppk use the overall standard deviation (all data combined) rather than the within-subgroup estimate. They answer "how has this process performed historically?" Cp/Cpk use the within-subgroup estimate and answer "what is this process capable of when in control?"
| Index pair | Uses | Answers |
|---|---|---|
| Cp / Cpk | Within-subgroup σ̂ | Potential capability (when stable) |
| Pp / Ppk | Overall sample std dev s | Actual performance (historical) |
Common exam traps
- Cp and Cpk only apply to stable, in-control processes. Calculate capability after confirming statistical control (run chart or control chart). An unstable process has a meaningless Cpk.
- Cpk ≤ Cp always. If your calculation gives Cpk > Cp, check your math.
- Cpk = 1.0 is not great. For a centered normal process (Cp = Cpk = 1.0) about 0.27% (2,700 ppm) falls outside spec; an off-center process with Cpk = 1.0 has about 0.135% beyond the nearer limit. Cpk ≥ 1.33 is a common minimum.
- The 6σ goal is 3.4 DPMO, not zero defects per se. It incorporates a 1.5σ shift for long-term drift.
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